Nanoscale metrology FAQ.

Start by contacting NanoFraction to discuss your sample and measurement objective before arranging shipment. Use our sample inquiry page or email info@nanofraction.com.

Include the material, sample dimensions and quantity, the feature or defect you want to investigate, and your target timeline. A photograph, an existing measurement, or a representative reference image helps us assess the application.

Ask us to confirm sample suitability, handling and packaging requirements, the receiving address, and the proposed scope before you ship. Mention any sensitivity to light, temperature, moisture, contamination, or handling, along with any relevant sample hazards. If the material is confidential, discuss the appropriate arrangements before sharing sensitive information.

NanoFraction screens optical signatures associated with defects and structural variation. What can be detected and classified depends on the material, optical configuration, and reference data.

Our diamond research examines dislocation-related signatures, defect locations and geometry, surface variation, and the surrounding gradient and stress signatures. These measurements can help identify regions for closer investigation and comparison with other characterization methods.

For silicon carbide, the defect classes and detection limits need to be established in a sample-specific feasibility and correlation study. Our published diamond results should not be treated as a validated SiC specification. Confirming a particular crystallographic defect type requires appropriate reference measurements.

Our DRAM proof of concept explores periodic optical signatures and their relationship to device layout. It does not yet establish production-ready defect classification.

NanoFraction develops non-destructive optical workflows for surface topography, roughness, bending, and stress-related signatures, with outputs defined and validated for each application. Suitable optical measurements can preserve the sample without conductive coating, sectioning, or vacuum preparation.

For a 3D surface or roughness result, the measurement needs an appropriate reference, calibrated lateral and height scales, and a defined analysis area. Requested roughness parameters and repeatability criteria should be agreed when the study is scoped.

Stress requires additional interpretation. A phase or gradient image is not automatically an absolute stress measurement. Quantitative stress values require a suitable material model, calibration, and reference validation. Where those are not established, results should be described as optical or stress-related signatures.

We assess illumination and handling conditions for your material before the study, particularly for light-sensitive or delicate samples.

Contact NanoFraction for a project-specific quote. Pricing depends on the sample set, measurement objective, optical setup, analysis, and validation required.

A feasibility study on representative samples has a different scope from a correlation pilot or a custom measurement system. Our service approach progresses from feasibility to validation and, where appropriate, an embedded workflow.

To help us scope the work, describe:

• The material, number of samples, and areas to be inspected.
• The feature size, measurement outputs, and decision you need to support.
• Available reference data and any required comparison method.
• Your timeline and whether the work is a one-time study or a recurring need.

The quotation should define the deliverables, schedule, and acceptance criteria for your project.

Yes. NanoFraction explores optical measurement workflows for particle processing, textiles, and other manufactured materials, with feasibility evaluated for each application.

Our rare-earth processing concept investigates particle size, shape, aggregation, and texture as potential process signals. The proposed workflow correlates those optical measurements with reference assays and operating data; optical appearance alone does not establish chemical composition or identify every mineral phase.

Our textile case study uses structured illumination and image analysis to locate and estimate the size of features within a defined garment region. It illustrates how related measurement principles can be applied at larger physical scales, with scale and depth calibration determined for that setup.

For a new material, tell us what changes in your process and what you need to measure. We can discuss whether an optical signal, an appropriate reference method, and a focused pilot can answer that question.